Getting good SEM/FESEM images is dependent on both the sample conditions (conductivity, bulk vs. thin film, etc) and the instrument’s imaging parameters (e.g., beam voltage, beam current, working distance, detector, etc). Over the course of training and interacting with hundreds of different FESEM users Dr. Liu has observed the most important things a new user […]

Funding for the CHIPS Act has been signed into law, providing tremendous opportunities for semiconductor industry organizations to expand production in the U.S. Although additional guidance from the Departments of Defense and Commerce is required around the specific application form and process, it’s critical for organizations to understand the programs, if their organization qualifies, and […]

Zoom in on microscopy and its connections to chemistry, physics, biology, and engineering using hands-on virtual research tools! This session will offer an overview about nanoscience and how microscopy tools such as scanning electron microscopes (SEM) can be brought directly into your classes remotely. Dr. Zac Gray of the NSF-supported Nanotechnology Applications and Career Knowledge (NACK) Network will […]