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MNTC-EC Workshop: Semiconductor Industry Overview
August 9, 2021 @ 9:00 am - 3:00 pm EDT
One event on August 10, 2021 at 9:00 am
Abe Michelen, SUNY Polytechnic Institute, New York
This two-day workshop will introduce the process of manufacturing integrated circuits, and the tools (Statistical Process Control) used by the industry to monitor and improve the quality of the final product.
A semiconductor chip (also called “integrated circuit (IC)”) is an electric circuit with many components such as transistors and wiring formed on a semiconductor wafer. The layout of the components is patterned on a photomask (reticle) by computer and projected onto a semiconductor wafer.
Statistical Process Control (SPC) is a key element to any successful quality program. The use of statistics in controlling the variation of any process is vital. This is important for the Semiconductor Industry.
General topics, include:
- Semiconductor industry overview
- Industry trends.
- IC Manufacturing Overview
- Materials in IC Manufacturing
- Semiconductor Fundamentals
- Front-end Processes: layering, doping, patterning, removal, thermal.
- Back-end Processes: test/sort, bump, background, die separation (sawing), die attach, wire bond, packaging, final test.
- Production areas in a wafer fab cleanroom: diffusion, lithography, etch, ion implantation, thin films, and CMP (polish)
- Introduction to MOSFETs
- Introduction to SPC
- Understanding what a process variation Is: Variation types
- Data & Control Charts
- SPC Tools: control charts
- Interpretation of control charts
- Learn how to use free-of-charge SPC software, to be distributed to participants – SPC for Excel and the open source program OpenStat